Wafer Tester (Visual Inspection)

A system to assist visual inspection of wafers by importing image data imported from cameras (front and rear) of a moving two axis stage (significantly improves efficiency).

image:Wafer tester (support for visual inspections)

Use

The software photographs chips lined up on a wafter positioned on the XY stage and a visual inspection is made as to the quality.

Programming language

Microsoft Visual Studio .NET 2003

System benefits and sales points

  • Inspection of both sides is carried out by having a camera on the front and rear.
  • Use of a pen tablet enables the operator to touch the image to record any defects as data.
  • As the images are saved, the data is kept to support the visual inspection.
  • Calibrate to suit the camera lens.

Technical features

  • Dual monitor compliant
  • Set the alignment of the stage.
  • As the images are saved, the data is kept to support the visual inspection.
  • Dual cameral control (simultaneous inspection of both sides)
  • Calibrate to suit the camera lens.
Inquiries